Focused Ion Beam

Gnvr Vikram

Atomic Force Microscopy, Focused Ion Beam, Nanoindentation, and Nanoindentation creep

Jon Hiller

Argonne National Laboratory

Department Member

Materials Science Division Department

Electron Microscopy, Electron Optics, Engineering, and Materials Characterisation

Diane Johnson

The Open University

Post-Doc

Department of Physical Sciences

Astronomy & Astrophysics, Chemistry, Cosmochemistry, and Egyptology

David Burn

Durham University

Graduate Student

Physics Department

Focused Ion Beam, Nanomagnetism, Spin Transfer Torque, and Spintronics

Tomasz Wojciechowski

Institute of Physics, Polish Academy of Sciences

Post-Doc

Nanolithography Department

Focused Ion Beam, Micro and Nanofabrication, Focused Ion Beam, Space Propulsion, Sample Preparation for Electron Microscopy, and Scanning Electron Microscopy

Martin Ritter

Hamburg University of Technology (TUHH)

Head

Electron Microscopy Division Department

3D Microscopy, Electron Microscopy, Focused Ion Beam, and Image Processing

Ying-Lung Daniel Ho

University of Bristol

Department Member

Electrical & Electronic Engineering Department

Cavity Quantum Electrodynamics, Chalcogenide glasses, Focused Ion Beam, and Nanophotonics

Ray Valery

MEO Engineering Company, Inc.

Department Member

PBS&T Department

Electron Beam Technologies, Focused Ion Beam, Instrumentation Design, and Ion beam irradiation for material modification

Susanne Zils

Public Research Center Henri Tudor

Department Member

AMS Department

Electrochemical Energy Storage Device, Electron Microscopy, Electron Tomography, and Focused Ion Beam

Emilie Gallois

VSG

Department Member

Communication Department

Communication, Focused Ion Beam, and Semiconductors

Jesus Hernandez

Universidad de Cadiz

Graduate Student

Dpto de Ciencia de los Mat. e Ing. Metal. y Q. I. Department

Focused Ion Beam, Materials Science, and Semiconductor Nanostructures

Mohammad Ali Mohammad

University of Alberta

Graduate Student

Electrical and Computer Engineering Department

Electron Beam Lithography, Focused Ion Beam, MEMS, and Mass Spectrometry
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